THIME project partners are exploring the capabilities of ellipsometric spectroscopy and hyperspectral imaging techniques for the on-line measurement of thinfilm thickness in OPVs. The optical instrument will be installed and validated in R2R printing machines.
The THIME project will develop an on-line optical instrument to measure thickness of Organic Photovoltaics (OPV) layers in roll-to-roll printing machines. The precompetitive prototype system will provide the organic electronics industry with a novel quality control system.
The 2-years R&D Project
THIME is a 2-year R&D project funded by the “Research for SMEs” scheme under the 7th Framework Programme. A consortium of 8 partners will develop an on-line tool to measure thin film thickness during the roll-to-roll processing of electronic devices.read more
Thin-film OPV are envisioned as being ubiquitously present on everyday surfaces such as paper, fabrics, or transparent windows. Solar cells could be incorporated onto a host of everyday objects, offering advantages in terms of weight, flexibility and low-cost production methods.read more
The THIME Solution
The THIME technology will be based in optical measuring techniques such as hyperspectral imaging and ellipsometry. Along the two-years project a preindustrial prototype system will be designed and built to validate its effectiveness and performance in industrial production facilities.read more