Optical technology for on-line measurement of thinfilm thickness

Optical technology for on-line measurement of thinfilm thickness

THIME project partners are exploring the capabilities of ellipsometric spectroscopy and hyperspectral imaging techniques for the on-line measurement of thinfilm thickness in OPVs. The optical instrument will be installed and validated in R2R printing machines.

Online measurement of OPV layers thickness

Online measurement of OPV layers thickness

The THIME project will develop an on-line optical instrument to measure thickness of Organic Photovoltaics (OPV) layers in roll-to-roll printing machines. The precompetitive prototype system will provide the organic electronics industry with a novel quality control system.

The 2-years R&D Project

THIME is a 2-year R&D project funded by the “Research for SMEs” scheme under the 7th Framework Programme. A consortium of 8 partners will develop an on-line tool to measure thin film thickness during the roll-to-roll processing of electronic devices.

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The Background

Thin-film OPV are envisioned as being ubiquitously present on everyday surfaces such as paper, fabrics, or transparent windows. Solar cells could be incorporated onto a host of everyday objects, offering advantages in terms of weight, flexibility and low-cost production methods.

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The THIME Solution

The THIME technology will be based in optical measuring techniques such as hyperspectral imaging and ellipsometry. Along the two-years project a preindustrial prototype system will be designed and built to validate its effectiveness and performance in industrial production facilities.

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